ci(adc): enable P4 ADC test and correct ADC performance thresh

This commit is contained in:
gaoxu
2024-10-28 09:46:51 +08:00
parent 0c82649db0
commit cfa487b4e0
9 changed files with 21 additions and 19 deletions
@@ -11,6 +11,7 @@
#include "driver/gpio.h"
#include "driver/rtc_io.h"
#include "soc/adc_periph.h"
#include "hal/adc_ll.h"
#define ADC_GET_IO_NUM(unit, channel) (adc_channel_io_map[unit][channel])
@@ -68,7 +69,7 @@
#define ADC_TEST_HIGH_THRESH 200
#elif CONFIG_IDF_TARGET_ESP32P4
#define ADC_TEST_LOW_VAL 3100
#define ADC_TEST_LOW_VAL 2152
#define ADC_TEST_LOW_THRESH 200
#define ADC_TEST_HIGH_VAL 4095
@@ -110,7 +111,7 @@ void test_adc_set_io_level(adc_unit_t unit, adc_channel_t channel, bool level)
{
TEST_ASSERT(channel < SOC_ADC_CHANNEL_NUM(unit) && "invalid channel");
#if SOC_ADC_DIG_CTRL_SUPPORTED && !SOC_ADC_RTC_CTRL_SUPPORTED
#if !ADC_LL_RTC_GPIO_SUPPORTED
uint32_t io_num = ADC_GET_IO_NUM(unit, channel);
TEST_ESP_OK(gpio_set_pull_mode(io_num, (level ? GPIO_PULLUP_ONLY : GPIO_PULLDOWN_ONLY)));
#else