Currently, REE SPI flash HAL operations are routed as service calls to TEE,
but the TEE implementation incorrectly uses ROM APIs instead of HAL APIs.
This leads to issues and is not the recommended approach.
- Rename `tee_test_fw` app configs for better CI tracking
- Decrease the lower bound of TEE I/DRAM config options
- Trim the TEE test-apps build
- Improve the TEE/REE OTA pytest script with additional checks
- Fix build issues when `tee_sec_storage`/`tee_ota_ops` are a
a part of the project build but ESP-TEE is disabled
- Decreased from 32KB to 24KB, keeping in mind the current maximum TEE heap
usage and some overhead
- Make the TEE panic handler logs concise, saving some DRAM
Laukik Hase