- Ensure bound checks correctly handle all scenarios, including
when a requested operation's (SPI0/1) range fully contains the
TEE-protected region.
- Disable delegation of INTWDT timeout and Cache error interrupts as they reset
the device after the panic handler
- Rename `tee_test_fw` app configs for better CI tracking
- Decrease the lower bound of TEE I/DRAM config options
- Trim the TEE test-apps build
- Improve the TEE/REE OTA pytest script with additional checks
- Fix build issues when `tee_sec_storage`/`tee_ota_ops` are a
a part of the project build but ESP-TEE is disabled
- Place the APM HAL into TEE IRAM when `CONFIG_SECURE_TEE_EXT_FLASH_MEMPROT_SPI1`
is enabled, as APM violations related to SPI1 can occur with the flash cache disabled.
- Also fix an issue where flash protection tests were passing due to incorrect checks
- Decreased from 32KB to 24KB, keeping in mind the current maximum TEE heap
usage and some overhead
- Make the TEE panic handler logs concise, saving some DRAM
- Remove `mret` for jumping to the service call dispatcher; instead, enable
interrupts and execute directly
- Fix potential corruption of the `t3` register when returning from a service
call
- Simplify the secure service dispatcher function
Also:
- Split the secure service table into two parts: one DRAM-resident and the
other DROM-resident. The former holds the services invoked when the cache is
disabled or suspended while the latter holds rest of the services.
Laukik Hase