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esp-idf
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32895539f2f961673094de4c92812fe0571fb142
esp-idf
/
components
/
esp_tee
/
test_apps
/
tee_test_fw
/
main
T
History
Laukik Hase
a45758dede
ci(esp_tee): Remove incorrect error checks for TEE flash protection tests
...
- Also fixed coverity issue from TEE secure storage
2025-11-06 17:20:04 +05:30
..
app_main.c
ci(esp_tee): Add tests for verifying behaviour for illegal flash accesses (SPI0)
2025-01-03 11:44:27 +05:30
CMakeLists.txt
feat(esp_tee): Miscellaneous fixes and updates
2025-10-14 10:12:12 +05:30
idf_component.yml
refactor(esp_tee): Add local components in TEE examples via
idf_component.yml
2025-02-11 10:15:19 +05:30
test_esp_tee_att.c
refactor(esp_tee): Update TEE secure storage examples and test-apps
2025-05-04 18:03:30 +05:30
test_esp_tee_ctx_switch.c
fix(esp_tee): Skip taking the service call mutex when in critical sections
2025-10-14 10:12:12 +05:30
test_esp_tee_flash_prot.c
ci(esp_tee): Remove incorrect error checks for TEE flash protection tests
2025-11-06 17:20:04 +05:30
test_esp_tee_interrupt.c
ci(esp_tee): Refactor the ESP-TEE test-cases
2025-10-14 10:12:11 +05:30
test_esp_tee_ota.c
…
test_esp_tee_panic.c
fix(esp_tee): Split TEE SRAM as I/DRAM for ESP32-C5 with PMA
2025-10-17 10:40:08 +05:30
test_esp_tee_sec_stg.c
feat(esp_tee): Added support for PBKDF2-based (HMAC) ECDSA signing
2025-10-14 10:12:13 +05:30