Files
esp-idf/components/esp_tee/test_apps/tee_test_fw
Laukik Hase 832124f198 fix(esp_tee): Place APM HAL in TEE IRAM when SPI1 protection is enabled
- Place the APM HAL into TEE IRAM when `CONFIG_SECURE_TEE_EXT_FLASH_MEMPROT_SPI1`
  is enabled, as APM violations related to SPI1 can occur with the flash cache disabled.
- Also fix an issue where flash protection tests were passing due to incorrect checks
2025-04-17 11:03:50 +05:30
..

Supported Targets ESP32-C6

ESP-TEE: Test Suite

  • ESP-TEE utilizes the pytest framework in ESP-IDF for executing the dedicated unit tests on the target. The test application includes cases spanning the following modules -

    • Secure service call interface
    • Interrupts and exception handling
    • Privilege violation
    • Cryptographic operations
    • TEE OTA updates
    • Secure storage
    • Attestation
  • For executing the test locally, ESP-IDF needs to be installed with the additional Python requirements.

cd $IDF_PATH
bash install.sh --enable-ci --enable-pytest
. ./export.sh
  • For example, to execute the TEE test suite for ESP32-C6 with all the available sdkconfig files, run the following steps. The required test applications will be built and flashed automatically onto the DUT by the pytest framework.
python $IDF_PATH/tools/ci/ci_build_apps.py . --target esp32c6 -v --pytest-apps
pytest --target esp32c6