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b44b88902ea100b5ebda955c8eaf346ae06bfe31
esp-idf
/
components
/
driver
/
test_apps
/
spi
/
master
T
History
wanlei
184145817c
spi_master: add feature spi periph clk source selectable
2023-01-18 15:40:12 +08:00
..
main
spi_master: add feature spi periph clk source selectable
2023-01-18 15:40:12 +08:00
CMakeLists.txt
…
partition_table_esp32_flash.csv
…
pytest_spi_master.py
test: enable multi-board test of spi for c6
2022-12-07 11:37:48 +08:00
README.md
ci: Make consistence between pytest_*.py and .build-test-rules.yml for esp32c6 (i.e. to pass check_test_scripts_build_test_rules.py)
2022-11-28 11:58:30 +08:00
sdkconfig.ci.defaults
test: re-enable some test cases of spi for esp32c2
2022-12-07 11:37:48 +08:00
sdkconfig.ci.freertos_compliance
test: re-enable some test cases of spi for esp32c2
2022-12-07 11:37:48 +08:00
sdkconfig.ci.freertos_flash
test: re-enable some test cases of spi for esp32c2
2022-12-07 11:37:48 +08:00
sdkconfig.ci.release
test: re-enable some test cases of spi for esp32c2
2022-12-07 11:37:48 +08:00
sdkconfig.defaults
…
sdkconfig.defaults.esp32
spi: bringup c6 spi master & slave driver support
2022-11-18 15:54:14 +08:00
sdkconfig.defaults.esp32s2
…
sdkconfig.defaults.esp32s3
…
README.md
Supported Targets
ESP32
ESP32-C2
ESP32-C3
ESP32-C6
ESP32-S2
ESP32-S3
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wanlei