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b9a6d276a2cda8a7aa0ec32fdff2ca71fd8b64fc
esp-idf
/
components
/
esp32
/
test
T
History
Angus Gratton
06e03ff52e
Replace backwards-compatible portTICK_RATE_MS with FreeRTOS v8+ portTICK_PERIOD_MS
...
Closes github
#51
https://github.com/espressif/esp-idf/issues/51
2016-12-28 10:23:13 +11:00
..
component.mk
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
logo.jpg
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_ahb_arb_asm.S
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_ahb_arb.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_deep_sleep.c
deep sleep: power down RTC peripherals in EXT1 sleep
2016-12-16 14:30:27 +08:00
test_fastbus_asm.S
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_fastbus.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_fp.c
remove fp unit test Kconfig
2016-11-23 16:22:34 +08:00
test_intr_alloc.c
Replace backwards-compatible portTICK_RATE_MS with FreeRTOS v8+ portTICK_PERIOD_MS
2016-12-28 10:23:13 +11:00
test_malloc_caps.c
Add testcase, fix executable memory allocated in shared dram/iram region
2016-12-15 15:03:22 +08:00
test_miniz.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_tjpgd.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00
test_unal_dma.c
add unit tests to esp-idf
2016-11-22 14:45:50 +08:00