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cbed615e0eaff4bd6cf87aaa0c5aca9f7544c607
esp-idf/components/esp_tee/test_apps
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Laukik Hase a45758dede ci(esp_tee): Remove incorrect error checks for TEE flash protection tests
- Also fixed coverity issue from TEE secure storage
2025-11-06 17:20:04 +05:30
..
tee_cli_app
fix(esp_tee): Use HAL APIs instead of ROM APIs for SPI flash service calls
2025-10-27 11:17:05 +05:30
tee_test_fw
ci(esp_tee): Remove incorrect error checks for TEE flash protection tests
2025-11-06 17:20:04 +05:30
.build-test-rules.yml
ci(esp_tee): Enable the TEE test-apps for ESP32-C5
2025-10-14 10:12:11 +05:30
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