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e313f56b30f539f17a857504da7758abe33b55d4
esp-idf/components/esp_tee/test_apps/tee_test_fw/main
T
History
Jiang Jiang Jian 3c39b32195 Chip/support esp32c61 v5.5
2025-07-22 12:21:36 +08:00
..
app_main.c
ci(esp_tee): Add tests for verifying behaviour for illegal flash accesses (SPI0)
2025-01-03 11:44:27 +05:30
CMakeLists.txt
feat(esp_tee): Protect the ECC peripheral from REE access
2025-04-16 19:19:04 +05:30
idf_component.yml
refactor(esp_tee): Add local components in TEE examples via idf_component.yml
2025-02-11 10:15:19 +05:30
test_esp_tee_att.c
refactor(esp_tee): Update TEE secure storage examples and test-apps
2025-05-04 18:03:30 +05:30
test_esp_tee_ctx_switch.c
ci(esp_tee): Verify the malloc-write-free cycle in the TEE heap
2025-04-08 19:50:27 +05:30
test_esp_tee_flash_prot.c
Chip/support esp32c61 v5.5
2025-07-22 12:21:36 +08:00
test_esp_tee_interrupt.c
feat(esp_tee): Support for ESP-TEE - the main component
2024-12-02 12:20:05 +05:30
test_esp_tee_ota.c
feat(esp_tee): Support for ESP-TEE - the main component
2024-12-02 12:20:05 +05:30
test_esp_tee_panic.c
refactor(esp_tee): Update TEE secure storage examples and test-apps
2025-05-04 18:03:30 +05:30
test_esp_tee_sec_stg.c
ci(esp_tee): Enable the tee_test_fw test app for ESP32-H2
2025-05-21 10:06:17 +05:30
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